ICEM MODELING OF MICROCONTROLLER CURRENT ACTIVITY

International audienceThe ICEM draft proposal deals with an extension of the IBIS [1] standard, aimed at predicting conducted-mode as well as radiated-mode emission [2]. This proposal provides a modeling methodology for the power supply network and the current activity of an integrated circuit. Thanks to these models, predicting conducted-mode emission levels on the chip as well as on the application board becomes possible by the means of SPICE-based analog simulations. This allows the chipmaker to better choose the chip package as well as the number of power supply pairs, and the integrator to fine tune the number of power supply networks and decoupling capacitors. The corresponding models may be elaborated either in the design phase or from measurements performed as soon as the silicon becomes available. This article briefly summarizes the ICEM model, then introduces the proposed methodology aimed at obtaining the current activity model from the measurements performed on the current consumed on the power supply pins of an IC

Towards nonlinearity measurement and simulation using common EMC equipment

International audienceIntegrated circuit (IC) models that predict functional failure are necessary for predicting the immunity of systems to electromagnetic interference (EMI). The integrated circuit immunity model for conducted immunity (ICIM-CI) of IEC 62433-4 assumes that the IC terminals still behave linearly at injection power levels that cause susceptibility. This hypothesis should be systematically verified when modelling integrated circuits for EMC, but this is not always straightforward. A simple measurement set-up using a directional coupler and a spectrum analyser is demonstrated to verify this linearity hypothesis using commonly available equipment. The measured reflected spectrum can be transformed into the |X11| parameter, which is the non-linear extension of the S11 parameter. X-parameters may be the key to predict susceptibility by simulation when the linearity hypothesis is invalid

EMC-ORIENTED ANALYSIS OF ELECTRIC NEAR-FIELD IN HIGH FREQUENCY

International audienceThis paper introduces an EMC-oriented study of the frequency-domain behavior of the electric field generated by two dipole antennas. First of all, the theoretical expression of this field is analyzed and confronted with the macromodel commonly used in electrical circuits. Then, the most significant components of the expression are included into the topological study of a two-dipole network through Kron's method. Finally, computed results are compared with experimental ones and show significant similarities

A Direct Power Injection Model for Immunity Prediction in Integrated Circuits

International audienceThis paper introduces a complete simulation model of a Direct Power Injection (DPI) setup, used to measure the immunity of integrated circuits to conducted continuous-wave interference. This model encompasses the whole measurement setup itself as well as the integrated circuit under test and its environment (printed circuit board, power supply). Furthermore, power losses are theoretically computed, and the most significant ones are included in the model. Therefore, the injected power level causing a malfunction of an integrated circuit, according to a given criterion, can be identified and predicted at any frequency up to 1 GHz. In addition to that, the relationship between immunity and impedance is illustrated. Simulation results obtained from the model are compared to measurement results and demonstrate the validity of this approach

Kron Simulation of Field-to-line Coupling Using a Meshed and a Modified Taylor Cell

International audiencePrinted Circuit Board (PCB) traces play a role in the immunity of electronic products. Contrary to Integrated Circuits (ICs), the layout of PCB traces can be changed rather late in a product's design. Therefore, it is interesting to equip the PCB designer with simple tools that predict the immunity of his PCB traces. In this article, we compare two simulations of field-to-long line coupling based on Taylor's model. Firstly, the line is meshed into electrically short Taylor cells and numerically simulated using Kron's method. Secondly, we use one modified Taylor cell, which does not need meshing and is a closed-form, analytical result. The two simulations turn out to be equally precise on a straight microstrip line, the meshed simulation being more flexible, the simulation using a modified Taylor cell being faster

The conducted immunity of SPI EEPROM memories

International audienceThis paper focus on the conducted immunity measurement of non-volatile memories up to 1 GHz. A specific measurement flow is introduced, which makes possible to compare the EMC performances in different test cases. Trough measurements and simulation, this study gives a real view on the immunity difference of this integrated circuits (IC)

Design of a 20 GHz DPI method for SOIC8

International audienceThe direct power injection (DPI) test defined in IEC 62132-4 measures the conducted immunity of integrated circuits (ICs) up to 1GHz. As the frequency of functional and interference signals is increasing, we would like to characterise immunity for higher frequencies as well. In this paper, we show why typical IEC 62132-4 compliant DPI set-ups become inaccurate when going up to 20GHz. We propose to determine the power Ptrans actually transmitted to the device under test (DUT) by using offline short-open-load-thru (SOLT) or thru-reflect-line (TRL) calibration. Furthermore, we design a low-cost FR4 printed circuit board (PCB) that allows for testing of SOIC8-packaged ICs. We verify that this board has acceptable and reproducible losses up to 20 GHz, as well as acceptable crosstalk

Design of a 20 GHz DPI method for SOIC8

The direct power injection (DPI) test defined in IEC 62132-4 measures the conducted immunity of integrated circuits (ICs) up to 1 GHz. As the frequency of functional and interference signals is increasing, we would like to characterise immunity for higher frequencies as well. In this paper, we show why typical IEC 62132-4 compliant DPI set-ups become inaccurate when going up to 20 GHz. We propose to determine the power Ptrans actually transmitted to the device under test (DUT) by using offline short-open-load-thru (SOLT) or thru-reflect-line (TRL) calibration. Furthermore, we design a low-cost FR4 printed circuit board (PCB) that allows for testing of SOIC8-packaged ICs. We verify that this board has acceptable and reproducible losses up to 20 GHz, as well as acceptable crosstalk.Peer ReviewedPreprin

Assessment of the Immunity of Unshielded Multicore Integrated Circuits to Near Field Injection

International audienceThis paper presents a comparative assessment of the electromagnetic immunity of 4 integrated logic cores to near-field injection. These cores, located on the same die, are identical from a functional point of view, but differ by their design strategies. The injection is performed above each core according to the 6 components of the electromagnetic field, using appropriate probes. These results demonstrate that the die and bondwires of an integrated circuit can be sensitive to both magnetic and electric fields, and that some design rules can improve the immunity of integrated circuits to near-field interference

Comparison of Field-To-Line Coupling Models: Coupled Transmission Lines Model versus Single-cell Corrected Taylor Model

International audienceModels for field-to-line coupling are interesting be- cause they help to predict the immunity of PCBs and explain the relation between routing and immunity. In this article a meandered PCB trace illuminated by EM field in a TEM cell is analysed. The near-end and far-end coupling is predicted using two models: a detailed and an approximative one. The detailed model is a circuit of coupled multi-conductor transmission lines evaluated with a circuit simulator. The approximative model consists of a single Taylor cell with an analytical modification evaluated using a numerical computing tool. Both predictions are compared with measurements and turn out to be equally precise. The advantage of the coupled lines model is its flexibility, the advantage of the modified Taylor model is its ease of use